TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.
-Further evolution makes it possible to leave observation and analysis to the instrument, improving efficiency- TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces the ...
If you want to build semiconductors at home, it seems like the best place to start might be to find a used scanning electron microscope on eBay. At least that’s how [Peter Bosch] kicked off his ...
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The SLIDEVIEW DX scanner provides microscope-quality images onscreen. The system’s objective uses the same leading-edge technology as our award-winning X Line ™ series to capture images with ...
Manipulating nanoscale light in scanning tunneling microscope junctions is attained by nanofabrication of gold tips using a focused ion beam technique. Researchers have demonstrated that a spectrum of ...
STARKVILLE, Miss.—Mississippi State’s Institute for Imaging and Analytical Technologies soon will be home to a scanning electron microscope so advanced that it will be the first of its kind in the ...
Introducing the FLUOVIEW ™ FV4000 confocal laser scanning microscope and FV4000MPE multiphoton laser scanning microscope, featuring groundbreaking advancements in imaging technology that empower ...
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