A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

More than 97% of electron microscope images aren’t reported in peer-reviewed scientific papers, according to a large-scale ...

A technical paper titled “SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering” was published (preprint) by researchers at imec, University of Ulsan, and KU ...

Semplor, a leading provider of innovative tabletop SEM solutions, and Digital Surf, renowned for its advanced surface imaging ...

Elemental analysis of glass helps us to uncover chemical compositions, therefore its applications are vast. These include quality control, production diagnosis, material verification, and more. This ...

To find scientific evidence of paper age and origin. There's more to a piece of paper than meets the eye - and paper analysis can find it. This specialized investigative process extracts historical ...