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TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
Modern Electron Backscattered Electron Diffraction (EBSD) detectors can quickly (in less than an ms) index a Kikuchi pattern, which is the diffraction pattern of crystalline materials in the SEM. With ...
The interaction volume of a characteristic X-Ray emission can be seen in Figure 1. Typical EDS analysis in an SEM is carried out at relatively high energy (greater than 10 kV), which results in a vast ...
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