In the world of embedded software development, defects can cripple projects, delay releases, and ultimately lead to failures that affect everything from consumer electronics to mission-critical ...

Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

IN preparing the tables for Prof. L. Rosenfeld's book 1 I noticed that an error was made in the mass-defects of the heavy isotopes as given in the "Isotopenbericht ...